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Semilab USA LLC.
in Thickness Monitors / Measurement, Materials Testing, Film Thickness Measurement Devices, Plasma Enhanced Chemical Vapor Deposition - PECVD, Research & Development, Physical Vapor Deposition - PVD, Surface Analysis Equipment, Atomic Force Microscopy (AFM)
We design, produce and sell metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process of semiconductor devices and solar cells, and also for R&D purposes in these areas.
101 Billerica Ave
Bldg 5, Suite 105
North Billerica, Massachusetts
1862
United States of America