Listings in Contamination Management Solutions, Motion Control and Atomic Force Microscopy (AFM)

Semilab USA LLC.

in Thickness Monitors / Measurement, Materials Testing, Film Thickness Measurement Devices, Plasma Enhanced Chemical Vapor Deposition - PECVD, Research & Development, Physical Vapor Deposition - PVD, Surface Analysis Equipment, Atomic Force Microscopy (AFM)

We design, produce and sell metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process of semiconductor devices and solar cells, and also for R&D purposes in these areas.

101 Billerica Ave
Bldg 5, Suite 105
North Billerica, Massachusetts 1862
United States of America

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Anderson Materials Evaluation, Inc.

in Surface Analysis Services, Materials Testing, Contamination Management Solutions, Analytical Services, Research & Development

Anderson Materials Evaluation offers materials analysis and testing, failure analysis, quality control, and materials and process R&D, XPS, GCMS, FTIR, TGA, DSC, TMA, UV-Vis, SEM/EDS, mechanical testing, corrosion, adhesive bonding, contamination

9051 Red Branch Rd.
Suite C
Columbia, Maryland 21045
United States of America

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Phytron, Inc.

in Automation Equipment, Actuators, Motion Control

600 Blair Park Road Suite 220
Vermont 5495
United States of America

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ASPEX Corporation

in Contamination Management Solutions

175 Sheffield Drive Suite 200 Delmont
California 15626
United States of America

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Qcept Technologies

in Wafer Inspection, Contamination Management Solutions

75 Fifth Street NW Suite 740
Georgia 30308
United States of America

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RHK Technology Inc.

in Surface Analysis Services, Surface Analysis Equipment, Atomic Force Microscopy (AFM)

1050 East Maple Road
Troy, Michigan 48083
United States of America

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