Listings in Contamination Management Solutions, Motion Control and Wafer Inspection

Anderson Materials Evaluation, Inc.

in Surface Analysis Services, Materials Testing, Contamination Management Solutions, Analytical Services, Research & Development

Anderson Materials Evaluation offers materials analysis and testing, failure analysis, quality control, and materials and process R&D, XPS, GCMS, FTIR, TGA, DSC, TMA, UV-Vis, SEM/EDS, mechanical testing, corrosion, adhesive bonding, contamination

9051 Red Branch Rd.
Suite C
Columbia, Maryland 21045
United States of America

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Phytron, Inc.

in Automation Equipment, Actuators, Motion Control

600 Blair Park Road Suite 220
Vermont 5495
United States of America

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ASPEX Corporation

in Contamination Management Solutions

175 Sheffield Drive Suite 200 Delmont
California 15626
United States of America

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JEOL USA, Inc.

in Wafer Inspection

Musashino 3-chome Akishima
Tokyo
Japan

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Hitachi

in Wafer Inspection

5100 Franklin Drive Pleasanton
California 94588
United States of America

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Hermes Microvision, Inc.

in Wafer Inspection, Research & Development

1762 Automation Parkway
San Jose, California 95131
United States of America

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Nanomotion, Inc.

in Wafer Inspection

1 Comac Loop Suite 14B2 Ronkonkoma
New York 11779
United States of America

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Nikon Instruments, Inc.

in Wafer Inspection

1300 Walt Whitman Road Melville
New York 11747-3064
United States of America

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